EPROM Sensitivity: Difference between revisions
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*N: number of data collections | *N: number of data collections | ||
*T50: | *T50: estimated typical time half of bits are erased | ||
*T100: | *T100: estimated typical time all bits are first erased in a stable manner | ||
*estimated typical time: currently RMS of N samples | |||
Latest revision as of 09:56, 30 March 2022
eetime results
https://github.com/JohnDMcMaster/eetime/
https://proghq.org/media/eetime/
McMaster
These results are intended to be relative to each other and easy to interpret even if they have shortcomings. Raw data files are linked above for the curious
| Vendor | Device | T50 (sec) | T100 (sec) | N | S/Ns | Notes |
|---|---|---|---|---|---|---|
| AMD | AM2764ADC | 200.2 | 315 | 5 | EE05
EE06 EE07 EE08 EE09 |
|
| Atmel | AT27C256R | 45.3 | 72.7 | 1 | EE23 | |
| Intel | D27C256 | 54.9 | 81.5 | 3 | E01 | |
| SSS | M2764AFI | 83.6 | 124.6 | 5 | E10
E11 E12 E13 E14 |
|
| ST | M27C256B | 348.5 | 701.3 | 3 | E17
E18 |
|
| ST | M27C512 | 129.7 | 195.2 | 10 | E20
E21 E22 |
|
| TI | TMS2764 | 0 | 75.5 | 6 | EE02
EE03 EE04 |
Where:
- N: number of data collections
- T50: estimated typical time half of bits are erased
- T100: estimated typical time all bits are first erased in a stable manner
- estimated typical time: currently RMS of N samples
Baseline is:
- New USHIO G4T5 bulb
- Bulb to chip distance: based on PE-140T EPROM eraser
- Some results are scaled based on calibration tests
- Ex: bulb2 takes longer so results are scaled back